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(parent: 2d2afdb) | patch
change setup teardown for group set opt tests
authorBastian Dehn <hhaalo@arcor.de>
Tue, 28 Oct 2025 17:23:30 +0000 (18:23 +0100)
committerBastian Dehn <hhaalo@arcor.de>
Tue, 28 Oct 2025 17:23:30 +0000 (18:23 +0100)
commit7acb9f7e33d745fa40c2ef293cf08956cb9d94f5
tree5ecc415b920881884dc87c5a8d4489f5ec8e8d16tree | snapshot
parent2d2afdb21779133162765a7ce655233c9965d121commit | diff
change setup teardown for group set opt tests
tests/kds_s2000w_net_set_opt_tests.c diff | blob | history
network sane backend for kodak s2000w series